Pantulan Total Teredam untuk Deteksi Magnon Polariton dalam Lapisan Tipis Bahan Logam Antiferromagnet

Abstract

The purpose of this research is to verify the existence of magnetic polaritons in thin film metallic antiferromagnet materials. The polaritons could be generated in metallic antiferromagnet materials by fabricating layered sample with an isolator non-magnetic materials, so that disturbance from screening effect by free electron could significantly be reduced. The method used to detect the magnetic polaritons is attenuated total reflection (ATR). The existence of magnetic polaritons is indicated by reduction of reflectance in ATR spectroscopy. The result show that the value of reflectivity in a certain direction is same with opposite direction with R(k) = R(-k), if external magnetic field isn’t applied to the system. This property is called reciprocal. If external magnetic field is then introduced to the system, the ATR spectroscopy show that the reflectivity will be nonreciprocal, with R(k) ≠ R(-k)