Difraksi Fraunhofer Sebagai Metode Alternatif Sederhana Untuk Spektroskopi

Abstract

Abstact The spectrum of a light source, i. e diode laser, had been measured using Fraunhofer diffraction at a single slit by observed intensity distribution of diffraction pattern. By varying the width of slit and the distance from the screen to the slit, the dark fringes to the center of diffraction are observed to obtained the value of wavelength, λ = (658 ± 28) nm, which are agreement to the reference value. The diffraction pattern can be observed clearly if the source of light is very monochromatic and coherence, and also it has a high intensity.